Power Electronics Reliability: State of the Art and Outlook

This article aims to provide an update of the reliability aspects research on power electronic components and hardware systems. It introduces latest advances in understanding failure mechanisms, testing methods, accumulated damage modeling, mission-profile-based prediction. Component-level examples (e.g., Si IGBT modules, SiC MOSFETs, GaN devices, capacitors, magnetic components) are used for illustration purposes addition system-level studies. The limitations associated open questions discussed identify future opportunities electronics reliability.